Secondment from Kaunas University of Technology (KTU) to Instituto de Telecomunicações (IT) – WP2

The researcher performed structural characterization of ZnO TNs using X-ray diffraction (XRD), conducted morphological analysis by scanning electron microscopy (SEM), and investigated surface topography and roughness using atomic force microscopy (AFM). Experimental data was analysed and interpreted to identify structure-property relationships, contributing to the assessment of ZnO TN suitability for neuromorphic device applications. The stay also included participation in research group meetings and internal seminars on advanced materials characterization, along with a presentation of progress and preliminary results to host institution researchers.

Training received covered advanced XRD data acquisition and analysis methods for nanostructured materials, SEM imaging and morphology evaluation of semiconductor nanostructures, AFM operation and surface roughness analysis, and data interpretation linking structural and functional material properties.

As a result, the researcher acquired comprehensive datasets describing the crystal structure, morphology, and surface characteristics of ZnO TNs, improved understanding of structure-performance relationships, and enhanced expertise in advanced characterization techniques and data analysis, generating results supporting the optimization of ZnO TNs for neuromorphic applications. For the project, this provided reliable structural and morphological data for developing ZnO TN-based neuromorphic devices, strengthened collaboration and knowledge exchange between partners, contributed to establishing structure-property relationships needed for device optimization, and supported the scientific objectives of Task 2.1 and the overall project goals.